The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7323687 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 29, 2008

Filed:

Sep. 22, 2005
Applicants:

Tomoaki Nanko, Musashino, JP;

Hideaki Yamagishi, Musashino, JP;

Shigeru Matsumura, Masashino, JP;

Inventors:

Tomoaki Nanko, Musashino, JP;

Hideaki Yamagishi, Musashino, JP;

Shigeru Matsumura, Masashino, JP;

Assignee:

Yokogawa Electric Corporation, Musashino-shi, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 5/02 (2006.01); G01N 21/61 (2006.01);
U.S. Cl.
CPC ...
Abstract

There are provided an infrared gas analyzer of a simple configuration, capable of taking measurements with high precision when using an infrared light source excellent in thermal responsiveness, and capable of ON/OFF operations at high speed, and an infrared gas analysis method using the same. The infrared gas analyzer having a sample cell into which a sample gas is distributed, for detecting concentration of a measuring target component of the sample gas by taking advantage of variation in absorption amount of infrared rays having passed through the sample cell, comprising a first infrared light source for irradiating the sample cell with first infrared rays, a second infrared light source having a response characteristic equal to that of the first infrared light source, a detector for detecting a difference between the first infrared rays emitted from the first infrared light source, and having passed through the sample cell, and second infrared rays emitted from the second infrared light source, a light source drive controller for synchronously driving the first and second infrared light sources, respectively, and a measurement controller for providing the light source drive controller with instructions for respective drive amounts of the first and second infrared light sources while receiving an output signal from the detector, thereby generating a measurement output corresponding to the concentration of the measuring target component of the sample gas.


Find Patent Forward Citations

Nanko, Tomoaki. (2008). Infrared gas analyzer and infrared gas analysis method (U.S. Patent No. 7323687). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7323687

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