The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 29, 2008

Filed:

Sep. 30, 2005
Applicants:

Yuanhong MA, Los Altos, CA (US);

Gerald M. Reaven, Stanford, CA (US);

Yuanshu Xie, Fremont, CA (US);

Xingyu Wang, Beijing, CN;

Lynn E. Murry, Fayetteville, AR (US);

Inventors:

Yuanhong Ma, Los Altos, CA (US);

Gerald M. Reaven, Stanford, CA (US);

Yuanshu Xie, Fremont, CA (US);

Xingyu Wang, Beijing, CN;

Lynn E. Murry, Fayetteville, AR (US);

Assignee:

Other;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A01N 1/02 (2006.01); G01N 33/48 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention provides a method for the determination of insulin sensitivity, insulin resistance, and non-insulin dependent Diabetes mellitus based on oral glucose tolerance test data and lipid ratios from reference populations that define an insulin resistance index. The invention also provides methods for using the IR index to determine disease progression and to evaluate the efficacy of the therapeutic agents. The invention further provides an IR calculator for automating diagnosis, producing and storing patient medical records.


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