The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 29, 2008

Filed:

Apr. 24, 2003
Applicants:

Ronald T. Laborde, San Diego, CA (US);

Randall N. Taff, San Diego, CA (US);

David M. Pratt, Carlsbad, CA (US);

Inventors:

Ronald T. LaBorde, San Diego, CA (US);

Randall N. Taff, San Diego, CA (US);

David M. Pratt, Carlsbad, CA (US);

Assignee:

Quantum Design, Inc., San Deigo, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/27 (2006.01); G01N 21/64 (2006.01); G01N 27/72 (2006.01); G01N 27/90 (2006.01); G01N 31/22 (2006.01); G01N 33/553 (2006.01);
U.S. Cl.
CPC ...
Abstract

An assay test strip and cassette. The test strip is positioned in a housing shaped and configured to allow a detector to access the test strip from the side, rather than from the lengthwise axis of the test strip. The housing may contain one or more test strips which may also be disposed on one or more surfaces of the housing. Preferably, the housing is generally C-shaped with the test strip spanning the space between the two arms of the C-shape. The housing is sealed to protect both the operator and instrument from possible contamination. The test strip is preferably embedded with paramagnetic particles and process chemistry specific for a particular application. Quantitative analysis may be accomplished using a magnetic reader device. In additional embodiments, detection is accomplished by visual means.


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