The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 2008
Filed:
Jul. 27, 2001
Applicants:
Jörg Heilek, Bammental, DE;
Bernd Eck, Viernheim, DE;
Dieter Baumann, Walldorf, DE;
Inventors:
Assignee:
BASF Aktiengesellschaft, Ludwigshafen, DE;
Primary Examiner:
Int. Cl.
CPC ...
C30B 7/08 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention relates to the use of an optical line detector for regulating the position of the wash front and/or of the build-up front of the crystal bed of a wash column in a melt crystallization process and a corresponding regulation method. The line detector, for example a CCD camera or a linear array of reflection probes, is arranged in such a way that optical properties of the crystal bed can be detected continuously in a region running parallel to the longitudinal axis of the wash column, this region covering the desired setpoint position of the wash front or of the build-up front.