The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 22, 2008
Filed:
Feb. 10, 2005
Kouichi Ichimura, Yokohama, JP;
Kenji Ohkuma, Yokohama, JP;
Mikio Fujii, Kawasaki, JP;
Hayato Goto, Kawasaki, JP;
Kentaro Torii, Tokyo, JP;
Kouichi Ichimura, Yokohama, JP;
Kenji Ohkuma, Yokohama, JP;
Mikio Fujii, Kawasaki, JP;
Hayato Goto, Kawasaki, JP;
Kentaro Torii, Tokyo, JP;
Kabushiki Kaisha Toshiba, Tokyo, JP;
Abstract
A microscope includes a photon source which sequentially generates sets of quantum-mechanically entangled photons including at least two photons, a lens which focuses a set of photons, an actuator which varies a relative distance between a focal position of the lens and a specimen with a minute displacement, a detector detecting photons transmitted through or scattered by the specimen, and a counter counting coincidence detections of n-numbers of photons with the detector during a gating time which is set so that a rate that a number of photons detected during thereof belong to a single set of quantum-mechanically entangled photons exceeds a predetermined rate depending on the varied relative distance.