The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 22, 2008

Filed:

Dec. 16, 2005
Applicant:

Daniel L. Brombolich, Saint Charles, MO (US);

Inventor:

Daniel L. Brombolich, Saint Charles, MO (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

According to one embodiment of the invention, a method for determining deformation of a surface of a material is provided. The method includes receiving, at a computer, an elastic deformation range and a plastic deformation range of the material. The method also includes modeling a region of the material with a mesh. The mesh includes a plurality of elements. The method also includes determining, by performing a finite element analysis on the mesh by the computer, a displacement for at least one point on each of the elements. The displacement results from a set of modeled boundary conditions. The finite element analysis includes recurrently approximating the modulus of elasticity for each element according to the elastic deformation range and the plastic deformation range. The act of approximating is based on a value of strain calculated from a previously calculated element displacement.


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