The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 22, 2008
Filed:
Mar. 08, 2005
Toshio Hanazawa, Kanagawa, JP;
Masaaki Ono, Kanagawa, JP;
Tsutomu Miyashita, Kanagawa, JP;
Hiroshi Tokunaga, Kanagawa, JP;
Hiroshi Ishikawa, Kawasaki, JP;
Toshio Hanazawa, Kanagawa, JP;
Masaaki Ono, Kanagawa, JP;
Tsutomu Miyashita, Kanagawa, JP;
Hiroshi Tokunaga, Kanagawa, JP;
Hiroshi Ishikawa, Kawasaki, JP;
Fujitsu Media Devices Limited, Yokohama, JP;
Fujitsu Limited, Kawasaki, JP;
Abstract
The present invention provides the stress detection method for force sensor device with multiple axis sensor device and force sensor device employing this method, whose installation angle is arbitrary. The stress detection method includes, first and second force sensors whose detection axes are orthogonal to each other. When the detection axis of first force sensor forms angle θ with direction of detected stress Ax, and the stress component of direction perpendicular to direction of the detected stress Ax is Az, output Apx of the axis direction of first force sensor is found as Apx=α(Ax×cos θ+Az×sin θ), and output Apz of the axis direction of the second force sensor is found as Apz=α(Ax×sin θ+Az×cos θ), and, when αand αare detection sensitivity coefficients of first and second force sensors respectively, the detection sensitivity coefficient αof second force sensor is set as α=αtan θ, and the detected stress Ax is found as Ax=(Apx−Apz)/α(cos θ−tan θ×sin θ).