The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 15, 2008
Filed:
Dec. 23, 2005
Katsumi Homma, Kawasaki, JP;
Toshiyuki Shibuya, Kawasaki, JP;
Hidetoshi Matsuoka, Kawasaki, JP;
Izumi Nitta, Kawasaki, JP;
Katsumi Homma, Kawasaki, JP;
Toshiyuki Shibuya, Kawasaki, JP;
Hidetoshi Matsuoka, Kawasaki, JP;
Izumi Nitta, Kawasaki, JP;
Fujitsu Limited, Kawasaki, JP;
Abstract
A delay analysis device includes a receiving unit that receives a result of a timing analysis of a target circuit to be analyzed, a detecting unit that detects critical paths having delays within a predetermined range, a statistical-delay computing unit that computes a statistical delay of the target circuit based on a cumulative probability distribution of the delays of the critical paths, and a probability-density-distribution computing unit that computes a probability density distribution of delay of a critical path that has the greatest delay in the result. The detecting unit detects x number of critical paths having cumulative delays within computed probability density distribution.