The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 15, 2008
Filed:
Nov. 03, 2001
Stefan Florek, Berlin, DE;
Michael Okruss, Potsdam, DE;
Helmut Becker-ross, Berlin, DE;
Abstract
A method for the wavelength calibration of echelle spectra, in which the wavelengths are distributed across number of orders is characterised by the steps: recording of a line-rich reference spectrum with known wavelengths for a number of the lines, determination of the position of a number of peaks of the reference spectrum in the recorded spectrum, selection of at least two first lines of known order, position and wavelength, determination of a wavelength scale for the order in which the known lines lie, by means of a fit function γ(x), determination of a provisional wavelength scale γ?m 1(x) for at least one neighboring order m 1, by means of addition/subtraction of a wavelength difference γwhich corresponds to a free spectral region, according to γm 1 ?(x)=γ(x)γwith γ(x)/m, determination of the wavelengths of lines in said neighboring order m 1, by means of the provisional wavelength scale γ 1(), replacement of the provisional wavelength of at least two lines by the reference wavelength for said lines as obtained in step (a) and repeat of steps (d) to (g) for at least one further neighboring order.