The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 15, 2008
Filed:
Nov. 12, 2003
Applicants:
Shunji Murai, Tokyo, JP;
Fumio Ohtomo, Tokyo, JP;
Hitoshi Otani, Tokyo, JP;
Inventors:
Assignee:
Kabushiki Kaisha Topcon, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C 3/08 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention relates to a surveying instrument for measuring the distance to a target to be measured, a horizontal angle, and a vertical angle by use of reflected light. An imager can be connected to the surveying instrument. In addition, an arithmetic processing means can determine a three-dimensional position of a plane part by determining from at least three measuring points an equation that includes the plane part as the target to be measured, and then by associating digital image data to which the plane part belongs with the equation so that the plane part is identified.