The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 08, 2008
Filed:
Sep. 19, 2002
Takeshi Yokota, Hitachi, JP;
Hisanori Nonaka, Tokai, JP;
Kenji Araki, Mito, JP;
Youichi Nishikawa, Tokyo, JP;
Makoto Kudoh, Kashiwa, JP;
Takeshi Yokota, Hitachi, JP;
Hisanori Nonaka, Tokai, JP;
Kenji Araki, Mito, JP;
Youichi Nishikawa, Tokyo, JP;
Makoto Kudoh, Kashiwa, JP;
Hitachi Plant Technologies, Ltd., Tokyo, JP;
Abstract
When the process plan made for execution is corrected based on the process correction condition, the variation amount in each of processes based on the process correction condition is calculated as the probability distribution using the probability distribution data generated by obtaining the probability distribution from the variation-amount prediction value of each of the processes. Thereby, the influence degree on other processes when the process is corrected can be estimated not simply as the propagation of the variation fixed value but so as to be more suited to the actual circumstances in accordance with the attribute information and the past variation patterns of the process.