The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 08, 2008
Filed:
Apr. 08, 2005
Applicants:
Kazuhiko Ninomiya, Kobe, JP;
Yoshiyuki Yanagimoto, Kobe, JP;
Inventors:
Kazuhiko Ninomiya, Kobe, JP;
Yoshiyuki Yanagimoto, Kobe, JP;
Assignee:
Agilent Technologies, Inc., Palo Alto, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for mapping a spectrum obtained from signals under test corresponding to linearly spaced frequencies to logarithmically spaced frequencies in a measuring apparatus. A spectrum within a predetermined frequency range from logarithmically spaced frequencies is selected from this spectrum corresponding to linearly spaced frequencies and vector averaging of the selected spectrum is performed.
Ninomiya, Kazuhiko. (2008). Method of mapping linearly spaced spectrum points to logarithmically spaced frequency and a measuring apparatus using the method (U.S. Patent No. 7317999). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7317999
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile