The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 08, 2008

Filed:

Aug. 10, 2005
Applicants:

Naresh Sundaram Iyer, Clifton Park, NY (US);

John Erik Hershey, Ballston Lake, NY (US);

James Kenneth Aragones, Clifton Park, NY (US);

Kai Frank Goebel, Ballston Lake, NY (US);

Weizhong Yan, Clifton Park, NY (US);

Piero Patrone Bonissone, Schenectady, NY (US);

Charles Terrance Hatch, Gardnerville, NV (US);

Inventors:

Naresh Sundaram Iyer, Clifton Park, NY (US);

John Erik Hershey, Ballston Lake, NY (US);

James Kenneth Aragones, Clifton Park, NY (US);

Kai Frank Goebel, Ballston Lake, NY (US);

Weizhong Yan, Clifton Park, NY (US);

Piero Patrone Bonissone, Schenectady, NY (US);

Charles Terrance Hatch, Gardnerville, NV (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01H 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for analyzing vibration including: acquiring a vibration signal; isolating a vibration signal event in the acquired signal; determining a frequency of a damped sinusoid of the vibration signal event, wherein the damped sinusoid characterizes the vibration signal event, and using the characteristic damped sinusoid to identify an occurrence of the vibration signal event in another vibration signal.


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