The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 08, 2008
Filed:
Jun. 16, 2004
Jason Brian Fascinato, Cincinnati, OH (US);
Timothy M. Martinkovic, Hamilton, OH (US);
Jason Brian Fascinato, Cincinnati, OH (US);
Timothy M. Martinkovic, Hamilton, OH (US);
General Electric Company, Schenectady, NY (US);
Abstract
A method and tooling for inspecting a contour of an edge of a cutout formed in a disk, each cutout fixedly receiving a turbine blade. A first device receives the disk containing the cutouts. A second device has a sensor associated with the movement of an instrument, the first device securing the disk at a predetermined orientation to the sensor. The disk is secured to the first device, the instrument being directed along the cutout defining a path substantially parallel to a surface of the contour, the instrument remaining in physical contact with the surface of the contour. The sensor transmits a signal associated with instrument movement to an algorithm to convert the signal to two-dimensional positions along the tangent path along the surface of the contour. The acceptability of the edge contour of the cutout is determined by comparing the two-dimensional positions to predetermined ranges of values.