The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 08, 2008
Filed:
Jan. 30, 2004
Blair H. Brumleý, La Jolla, CA (US);
Eugene A. Terray, Falmouth, MA (US);
Brandon S. Strong, San Diego, CA (US);
Blair H. Brumleý, La Jolla, CA (US);
Eugene A. Terray, Falmouth, MA (US);
Brandon S. Strong, San Diego, CA (US);
Teledyne RD Instruments, Inc., Poway, CA (US);
Abstract
A system and method for measuring the directional spectrum of one or more waves in a fluid medium using a multi-beam sonar system is disclosed. In an exemplary embodiment, range cells located within a plurality of acoustic beams are sampled to provide current velocity data. Optionally, wave surface height and pressure data is obtained as well. A sensitivity vector specifically related to the ADCP's transducer array geometry is used in conjunction with maximum likelihood method (MLM), iterative maximum likelihood method (IMLM), or other similar methods to solve a the wave equation at each frequency and produce a frequency-specific wave directional spectrum. The frequency-specific spectra are combined to construct a complete two-dimensional wave directional spectrum.