The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 08, 2008
Filed:
Jan. 23, 2003
Michael J. Mater, Kentwood, MI (US);
Michael J. Mater, Kentwood, MI (US);
Coherix, Inc., Ann Arbor, MI (US);
Abstract
An interferometry method using a laser of nominally fixed—but unknown and changing—frequency and phase angle, for example, attributable to laser drift. The interference pattern is periodically sampled at a frequency considerably higher than the phase shift of the object. The wavelength is reconstructed from the sampled patterns using a correlation algorithm. The phase angle is determined using an n-bucket algorithm. After all of the complex information has been determined at all of the multiple wavelengths, the surface of the object is calculated using conventional interferometry techniques. Accordingly, laser drift—typically considered a negative attribute—is used positively.