The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 08, 2008
Filed:
Sep. 09, 2005
Pavel Cheben, Ottawa, CA;
Ian Powell, Ottawa, CA;
Siegfried Janz, Gloucester, CA;
Dan-xia Xu, Gloucester, CA;
Pavel Cheben, Ottawa, CA;
Ian Powell, Ottawa, CA;
Siegfried Janz, Gloucester, CA;
Dan-Xia Xu, Gloucester, CA;
National Research Council of Canada, Ottawa, Ontario, CA;
Abstract
A spectroscopic method and system for the spectral analysis of an optical signal directed to a wavelength dispersive component having two interleaved dispersive devices. For a single wavelength, the optical signal exiting the interleaved dispersive devices includes two wavefronts generally disposed at an angle to one another and producing an interference pattern. The interference pattern is detected and subsequently analyzed via a Fourier transform to produce the optical spectrum of the input beam. The method and system are applicable in a planar waveguide environment, in reflection and transmission geometries.