The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 08, 2008
Filed:
Nov. 08, 2005
Bart Buijsse, Eindhoven, NL;
Robert Frans Maria Hendriks, Overlangel, NL;
Bart Buijsse, Eindhoven, NL;
Robert Frans Maria Hendriks, Overlangel, NL;
Other;
Abstract
The invention describes a method of determining the position of fluorescent markers in a sample (), with a high spatial resolution. To this end, the sample () is illuminated with an exciting light beam (), while the sample () is simultaneously scanned by a particle beam (). During scanning, markers will be impinged upon by the particle beam () and will be damaged, in such a manner that the marker impinged upon will no longer emit fluorescence radiation. This leads to a reduction of the flux of fluorescence radiation. This reduction is detected. Seeing as the position of the particle beam () w.r.t. the sample is known at the moment that the marker is damaged, the position of the marker in the sample is, accordingly, also known.