The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 08, 2008
Filed:
Apr. 30, 2004
Applicants:
Yasuhisa Inao, Kanagawa, JP;
Toshihiro Fuse, Kanagawa, JP;
Shinji Nakasato, Kanagawa, JP;
Inventors:
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/88 (2006.01);
U.S. Cl.
CPC ...
Abstract
A tightly adhering state between an elastically deformable first substrate deformed and made to tightly adhere to an elastically undeformable second substrate is detected by way of displacement of the light receiving position of a light receiving section adapted to receive light emitted from a light source for the first substrate and reflected by the first substrate.
Quick Actions:
Inao, Yasuhisa. (2008). Method of detecting tightly adhering state, tight adhesion control method and method of and apparatus for near field exposure (U.S. Patent No. 7317197). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7317197
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile