The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 08, 2008

Filed:

Dec. 24, 2003
Applicants:

Shinichi Kawabata, Sakai, JP;

Kenichi Iwami, Sakai, JP;

Yoshiyuki Katayama, Sakai, JP;

Inventors:

Shinichi Kawabata, Sakai, JP;

Kenichi Iwami, Sakai, JP;

Yoshiyuki Katayama, Sakai, JP;

Assignee:

Kubota Corporation, Osaka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B07C 5/00 (2006.01); G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In order to provide a quality evaluation apparatus having excellent measurement accuracy in obtaining quality evaluation values of fruits and vegetables, transmitted light from one or more measured objects is received by a photo-detective sensor of the charge storage type, charges are stored in the photo-detective sensor until a predetermined charge storage time lapses from start of the charge storage, a charge storage discharge process is repeatedly executed for releasing the charges stored in the photo-detective sensor until lapse of a predetermined discharge time, the stored charges are released when the measured object reach a position for measurement, and a measurement charge storage process is executed for storing charges to be used as photo-detective information for quality evaluation.


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