The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 01, 2008
Filed:
May. 22, 2003
Applicants:
Hans Manhaeve, Sint-Michiels, BE;
Piet DE Pauw, Oudenaarde, BE;
Inventors:
Hans Manhaeve, Sint-Michiels, BE;
Piet De Pauw, Oudenaarde, BE;
Assignee:
Q-Star Test N.V., Bruges, BE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/30 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention is related to a method for testing a micro-electronic device, by applying a plurality of test vectors to said device, and measuring for each test vector, the quiescent supply current I, to said device, wherein each Imeasured value is divided by another Ivalue, and wherein the result of said division is compared to a predefined reference, resulting in a pass or fail decision for said device.