The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 01, 2008
Filed:
Sep. 15, 2004
Hidetoshi Kumiya, Yamanashi, JP;
Katsutoshi Takizawa, Tokyo, JP;
Hidetoshi Kumiya, Yamanashi, JP;
Katsutoshi Takizawa, Tokyo, JP;
Fanuc Ltd, Yamanashi, JP;
Abstract
(1) Orthogonal transformation is applied to sample images based on the images of a normalized orthogonal system, and component groups are determined. A plurality of comparison target images are selected from an input image, and a partial normalized orthogonal system is created from the normalized orthogonal system by decreasing the dimensions. (2) Based on the partial normalized orthogonal system, orthogonal transformation is applied to the comparison target images, so as to determine the partial component group for each comparison target image. A comparison target image having high consistency with one of the sample images is extracted by comparison and collation between these partial component groups and the partial component groups which include each element of each partial normalized orthogonal system among component groups of each sample image. And a new comparison target image group is selected near the extracted image, and a new partial normalized orthogonal system is created by increasing the dimensions. Then (2) is repeated.