The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 01, 2008
Filed:
Mar. 13, 2003
Applicants:
Paul H. Fontaine, Richardson, TX (US);
Abdellatif Bellaouar, Dallas, TX (US);
Bertan Bakkaloglu, Plano, TX (US);
Inventors:
Paul H. Fontaine, Richardson, TX (US);
Abdellatif Bellaouar, Dallas, TX (US);
Bertan Bakkaloglu, Plano, TX (US);
Assignee:
Texas Instruments Incorporated, Dallas, TX (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03D 3/24 (2006.01); H03L 7/06 (2006.01);
U.S. Cl.
CPC ...
Abstract
A sample-and-hold (SAH) phase detector (PD) is clocked in such a way (using a reverse clocking mode) so as to avoid quantization noise increases due to folding that is generally associated with conventional charge pump based phase detectors. The PD is clocked with a clean clock (reference clock), rather than a divided clock. The SAH PD architecture additionally includes an integrated filtering function.