The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 01, 2008
Filed:
Mar. 23, 2005
Applicants:
Atsushi Fujihara, Kanagawa-ken, JP;
Michio Nakayama, Tokyo, JP;
Inventors:
Atsushi Fujihara, Kanagawa-ken, JP;
Michio Nakayama, Tokyo, JP;
Assignee:
Kabushiki Kaisha Toshiba, Tokyo, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 27/10 (2006.01); G02B 27/14 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method and apparatus for laser marking is disclosed. An interference fringe is formed on a subject to be marked using a laser beam to make a marking.
Fujihara, Atsushi. (2008). Method of laser marking, laser marking apparatus and method and apparatus for detecting a mark (U.S. Patent No. 7315421). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7315421
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile