The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 01, 2008
Filed:
Jun. 13, 2002
Kazuhiko Kinoshita, Aichi, JP;
Megumi Shio, Kanagawa, JP;
Kazuhiko Kinoshita, Aichi, JP;
Megumi Shio, Kanagawa, JP;
Japan Science and Technology Corporation, Saitama, JP;
Abstract
An optical microscope of high stability such that problems wherein an image of a sample becomes unsharp during observation and movement (drift) of the object point (object) occurs are solved because the defocusing in the Z direction attributable to thermal expansion of the optical microscope is compensated. The optical instruments are characterized as comprising an optical system unit symmetrical to the optical axis in terms of weight and shape and a peripheral unit having a sample positioning mechanism is constituted by combining components having temperature dependences close to zero.