The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 01, 2008
Filed:
Sep. 28, 2005
Method of measuring electric field distribution and electric field distribution measuring instrument
Hiroki Funato, Yokohama, JP;
Takashi Suga, Yokohama, JP;
Kouichi Uesaka, Yokohama, JP;
Satoshi Nakamura, Yokohama, JP;
Hiroki Funato, Yokohama, JP;
Takashi Suga, Yokohama, JP;
Kouichi Uesaka, Yokohama, JP;
Satoshi Nakamura, Yokohama, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
A method and apparatus for measuring an electric field distribution according to the present invention calculates a distribution of electric field intensity and its direction at arbitrary positions on the surface of the electronic apparatus or its circumference with use of data of measurement positions and measurement results of a potential distribution on a surface of an electronic apparatus. Further, it clearly indicates a flow of electromagnetic energy on the surface or in the circumference of the electronic apparatus by applying mathematical treatments to a magnetic field distribution at circumferential positions of the electronic apparatus. Thus, a distribution of high-frequency electric field generated from the electronic apparatus is measured with high accuracy.