The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 01, 2008
Filed:
Jul. 20, 2005
Nobuhiro Takamizawa, Sagamihara, JP;
Yujin Arai, Tokyo, JP;
Nobuhiro Takamizawa, Sagamihara, JP;
Yujin Arai, Tokyo, JP;
Olympus Corporation, Tokyo, JP;
Abstract
A laser scanning microscope enables an observation of a specimen through emitting a laser beam onto the specimen marked by a plurality of fluorescent probes and receiving a fluorescent light back from the specimen corresponding to the emission, and comprises a laser source for generating a laser beam in an excitation wavelength corresponding to the plurality of fluorescent probes, a deflector unit for scanning the generated laser beam over an observation plane of the specimen, a dispersion unit for dispersing a fluorescent light from the specimen to extract it by an arbitrary wavelength interval, a spectral data acquisition condition setting unit for setting a condition for the dispersion unit acquiring a spectral data based on spectrum characteristics of the plurality of fluorescent probes, a dispersion control unit for controlling the dispersion unit based on the set spectral data acquisition condition.