The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 01, 2008

Filed:

May. 22, 2006
Applicants:

Murti V. Salapaka, Ames, IA (US);

Tathagata DE, Ames, IA (US);

Pranav Agarwal, Ames, IA (US);

Deepak Ranjan Sahoo, Ames, IA (US);

Inventors:

Murti V. Salapaka, Ames, IA (US);

Tathagata De, Ames, IA (US);

Pranav Agarwal, Ames, IA (US);

Deepak Ranjan Sahoo, Ames, IA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/28 (2006.01); G02B 6/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

An approach to detect when a cantilever loses interaction with a sample, thereby detecting when a portion of an image obtained using a cantilever is spurious is presented. An observer based estimation of cantilever deflection is compared to the cantilever deflection and the resulting innovation is used to detect when the cantilever loses interaction. The loss of interaction is determined when the innovation is outside of and/or below a threshold level.


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