The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 25, 2007
Filed:
Mar. 23, 2006
Sungjun Chun, Austin, TX (US);
Timothy M. Skergan, Austin, TX (US);
Ching Lung Tong, Highland Mills, NY (US);
Roger Donell Weekly, Austin, TX (US);
Sungjun Chun, Austin, TX (US);
Timothy M. Skergan, Austin, TX (US);
Ching Lung Tong, Highland Mills, NY (US);
Roger Donell Weekly, Austin, TX (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A computer implemented method, testing system, computer usable program code, and apparatus are provided for measuring microprocessor susceptibility to internal noise A noise generator modulates a clock signal to generate noise on a targeted component within a microprocessor. A function generator executes microprocessor functions on a plurality of functional components within the microprocessor. A maximum execution frequency on the plurality of functional components is then measured and a set of frequency ranges where the functional components are susceptible to the generated noise is determined.