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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7313490 B1

PDFFull Text
Date of Patent:
Dec. 25, 2007

Filed:

Dec. 31, 2003

Wavelet analysis of one or more time domain reflectometry (tdr) signals to determine one or more characteristics of one or more anomalies in a wire

Applicants:

Kendall S. Wills, Sugar Land, TX (US);

Kartik Ramanujachar, Sugar Land, TX (US);

Michael D. Dockins, Waxahachie, TX (US);

Inventors:

Kendall S. Wills, Sugar Land, TX (US);

Kartik Ramanujachar, Sugar Land, TX (US);

Michael D. Dockins, Waxahachie, TX (US);

Assignee:

Texas Instruments Incorporated, Dallas, TX (US);

Attorneys:

Yingsheng Tung

Wade James Brady, III

Frederick J. Telecky, Jr.

Primary Examiner:

Bryan Bui

Int. Cl.
CPC ...
G01R 13/00 (2006.01); G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In one embodiment, a method for wavelet analysis of one or more time domain reflectometry (TDR) signals to determine one or more characteristics of one or more anomalies in a wire includes receiving a TDR signal that has reflected back up a wire from an anomaly in the wire, calculating a wavelet analysis result from a wavelet analysis of the TDR signal, accessing a library of one or more reference wavelet analysis results that each correspond to one or more known anomalies having one or more known characteristics, and comparing the wavelet analysis result with one or more reference wavelet analysis results. If the wavelet analysis result corresponds to one or more particular reference wavelet analysis results, it is indicated that the anomaly in the wire has one or more particular known characteristics of one or more particular known anomalies corresponding to the one or more particular reference wavelet analysis results. If the wavelet analysis result of the TDR signal does not correspond to one or more reference wavelet analysis results, it is indicated that the anomaly in the wire lacks one or more known characteristics of one or more known anomalies corresponding to one or more reference wavelet analysis results in the library.

Find Patent Forward Citations

Wills, Kendall. (2007). Wavelet analysis of one or more time domain reflectometry (tdr) signals to determine one or more characteristics of one or more anomalies in a wire (U.S. Patent No. 7313490). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7313490

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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