The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 25, 2007
Filed:
Aug. 29, 2001
Norihiko Murata, Kanagawa, JP;
Takashi Kitaguchi, Kanagawa, JP;
Shin Aoki, Kanagawa, JP;
Ricoh Company, Ltd., Tokyo, JP;
Abstract
In image processing method and apparatus of the present invention, image distortions caused by oblique imaging are corrected. A feature point of one of a plurality of partially overlapping images corresponding to a common location of an original image, shared by the plurality of partially overlapping images, is determined. A matched point of one of the other partially overlapping images corresponding to the feature point is determined so that a direction of the object plane is calculated based on the feature point and the matched point. One of the plurality of partially overlapping images is selected as a standard image whose image distortions are to be corrected. A distortion-corrected image is generated on a projection plane by projecting the standard image onto the projection plane based on the direction of the object plane such that image distortions in the standard image are eliminated.