The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 25, 2007

Filed:

Feb. 10, 2005
Applicant:

Richard A. Sones, Cleveland, OH (US);

Inventor:

Richard A. Sones, Cleveland, OH (US);

Assignee:

Applied Vision Company, LLC, Cuyahoga Falls, OH (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system to monitor randomly oriented objects on a process line are disclosed. A color camera is used initially to collect a set of training images from a set of training objects on a process line. The training images represent various random spatial orientations of the training objects with respect to the color camera. The training objects serve as the standard for the process. The training images are stored in a computer-based platform. The color camera is then used to capture images of monitored objects as the monitored objects pass by the color camera on the process line. The monitored objects have a random spatial orientation with respect to the color camera as the monitored objects pass through the field-of-view of the color camera. The captured images of the monitored objects are processed by the computer-based platform and compared to the training images in order to determine if certain characteristic parameters of the monitored objects have deviated from those same characteristic parameters of the training objects. If so, the process may be adjusted to correct for the deviations in order to bring the process back into tolerance.


Find Patent Forward Citations

Loading…