The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 25, 2007
Filed:
Sep. 12, 2003
Peter Alleine Fletcher, Rozelle, AU;
Stephen James Hardy, Leichhardt, AU;
Kieran Gerard Larkin, Putney, AU;
Peter Alleine Fletcher, Rozelle, AU;
Stephen James Hardy, Leichhardt, AU;
Kieran Gerard Larkin, Putney, AU;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
A method () is disclosed of detecting one or more patterns embedded in an image. Each pattern embedded in the image has been formed from a one-dimensional basis function. The method () starts by calculating () a projective transform of the image. A 1-D correlation is then calculated () between the projective transform and the basis function for a selection of angles. Finally, one or more peaks of the correlation are found (). The position of each of the peaks provides spatial parameters of one of the one or more embedded patterns.