The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 25, 2007
Filed:
Aug. 08, 2005
Applicants:
Akihiko Nishide, Tokyo, JP;
Kotoko Morikawa, Tokyo, JP;
Akira Hagiwara, Tokyo, JP;
Yasuhiro Imai, Tokyo, JP;
Inventors:
Akihiko Nishide, Tokyo, JP;
Kotoko Morikawa, Tokyo, JP;
Akira Hagiwara, Tokyo, JP;
Yasuhiro Imai, Tokyo, JP;
Assignee:
GE Medical Systems Global Technology Company, LLC, Waukesha, WI (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/03 (2006.01);
U.S. Cl.
CPC ...
Abstract
A scan control method for an X-ray CT apparatus wherein a subject with a contrast agent injected therein is helically scanned with an X-ray beam and image reconstruction is performed based on projection data obtained through an X-ray detector. The method includes controlling a velocity of a helical scan following motion of the contrast agent in the subject.