The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 25, 2007

Filed:

Aug. 03, 2005
Applicant:

Kuniyasu Haginiwa, Kanagawa, JP;

Inventor:

Kuniyasu Haginiwa, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of aligning an object including steps of detecting an image of a mark on the object with respect to each of a plurality of areas on the object, obtaining a position of the mark based on the detected image with respect to each image detected in the detecting step, extracting a feature of the mark based on the detected image with respect to each image detected in the detecting step, determining a correction value based on previously prepared information to relate the extracted feature to the correction value, with respect to each position obtained in the obtaining step, correcting the obtained position based on the correction value with respect to each position obtained in the obtaining step, and calculating a position of each of a plurality of areas on the object based on positions corrected in the correcting step.


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