The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 25, 2007
Filed:
Mar. 27, 2006
Roland Zumbrunn, Wittinsburg, CH;
Albert Markendorf, Suhr, CH;
Raimund Loser, Sisseln, CH;
Jürgen Dold, Sempach, CH;
Roland Zumbrunn, Wittinsburg, CH;
Albert Markendorf, Suhr, CH;
Raimund Loser, Sisseln, CH;
Jürgen Dold, Sempach, CH;
Leica Geosystems AG, Heerbrugg, CH;
Abstract
A measurement system for determining six degrees of freedom (α, β, d, φ, χ, ψ) of a reflector () or of an object () on which the reflector is arranged, comprises an angle- and distance measurement apparatus (), e.g. a laser tracker, operating with a laser beam as a measurement beam (). The reflector () is designed for a parallel reflection of the measurement beam () and has an apical opening or surface (), in a manner such that a part of the measurement beam () directed onto the reflector (), passes through the apical opening or surface (), and is incident on a light-sensitive surface () arranged behind the reflector apex. Five degrees of freedom (α, β, d, φ, χ) of the reflector () or the object () are computed from measurement data produced by the angle- and distance measurement apparatus () and by the light-sensitive surface ().