The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 25, 2007

Filed:

Mar. 09, 2005
Applicants:

Adrian Land, San Carlos, CA (US);

Lee Earley, Mountain View, CA (US);

Mark Hardman, Sunnyvale, CA (US);

Rexford T. Heller, San Jose, CA (US);

Michael W. Senko, Sunnyvale, CA (US);

Inventors:

Adrian Land, San Carlos, CA (US);

Lee Earley, Mountain View, CA (US);

Mark Hardman, Sunnyvale, CA (US);

Rexford T. Heller, San Jose, CA (US);

Michael W. Senko, Sunnyvale, CA (US);

Assignee:

Thermo Finnigan LLC, San Jose, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
B01D 59/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of controlling the population of ions in a mass spectrometer in which a first sample of ions is provided in the mass spectrometer, a measure of abundance of a species of interest in the first sample of ions is determined, the measure of abundance comprising an intensity value, and a second sample of ions is introduced into the mass spectrometer. The second sample of ions is introduced in an amount determined at least in part on the measure of abundance of the species of interest in the first sample of ions.


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