The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 25, 2007
Filed:
Aug. 14, 2006
Takafumi Ishitsu, Hitachi, JP;
Kensuke Amemiya, Hitachinaka, JP;
Yuuichirou Ueno, Hitachi, JP;
Takashi Matsumoto, Hamura, JP;
Takashi Matsumoto, Hadano, JP;
Takafumi Ishitsu, Hitachi, JP;
Kensuke Amemiya, Hitachinaka, JP;
Yuuichirou Ueno, Hitachi, JP;
Takashi Matsumoto, Hamura, JP;
Takashi Matsumoto, Hadano, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
A processing circuit, which carries out coincidence counting, acquires calibration data so that time delays of γ-ray detection signals from radiation detectors coincide with one another. A technique for acquiring calibration data faster and easily is provided to attain high time precision and respond to multi-channeling of detectors. A signal from a test signal generator is sent to signal processing apparatuses and coincidence count events are generated as a test. The events generated are processed by a delay time control apparatus and a variable delay circuit is controlled to improve the accuracy of coincidence counting.