The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 25, 2007
Filed:
Aug. 23, 2005
Heinz Tovar, Siegsdorf, DE;
Heinz Tovar, Siegsdorf, DE;
Dr. Johannes Heidenhain GmbH, Traunreut, DE;
Abstract
An optical position measuring system that includes a measuring graduation and a scanning unit that is movable in relation to the measuring graduation in a measuring direction. The scanning unit includes a light source that generates light towards the measuring graduation so that scanning signals result from an interaction of the light with the measuring graduation and an opto-electronic detector arrangement has a plurality of detector element units, whose geometric shape and/or arrangement has been selected in such a way that through them at least a partial filtering of undesired harmonics out of the scanning signals results. The measuring graduation includes an arrangement of graduation areas with different optical properties, which is periodic in the measuring direction and has a periodicity TPM and which has been selected in such a way that through them at least a partial filtering of undesired harmonics out of the scanning signals results.