The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 25, 2007
Filed:
Apr. 14, 2005
Bernd Nebendahl, Ditzingen, DE;
Bernd Nebendahl, Ditzingen, DE;
Agilent Technologies, Inc., Palo Alto, CA (US);
Abstract
The present invention relates to a determination of a physical state of an optical device by measuring a response signal. At least two subsequent measurements are executed. Therefore, a first optical signal is transmitted to the optical device, wherein a first optical property of said first signal is varied according to a first function of the time. A second optical property of a first response signal returning from the optical device is measured over the time and a first result function of the second optical property of the first response signal over the first optical property of first optical signal is established. Further, a second optical signal is transmitted to the optical device, wherein the first optical property of said signal is varied according to a second function of the time that is different from the first function of time. The second optical property of the corresponding second response signal is measured and a second result function of the second optical property of the response signal over the first optical property of the transmitted optical signal is established. The physical state of the optical device is determined on the base of a combination of the first and second result functions.