The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 25, 2007

Filed:

Apr. 16, 2002
Applicants:

Youssef Wakil, Houston, TX (US);

Vasyl V. Molebny, Kiev, UA;

Sergiy Molebny, Houston, TX (US);

Ioannis Pallikaris, Crete, GR;

Inventors:

Youssef Wakil, Houston, TX (US);

Vasyl V. Molebny, Kiev, UA;

Sergiy Molebny, Houston, TX (US);

Ioannis Pallikaris, Crete, GR;

Assignee:

Tracey Technologies, LLC, Houston, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

Eye refraction is measured to achieve desired quality via a selected vision characteristics. A characteristic of vision is selected to correlate to the desired quality of vision from a group of vision characteristics comprising acuity, Strehl ratio, contrast sensitivity, night vision, day vision, and depth of focus, dynamic refraction over a period of time during focus accommodation, and dynamic refraction over a period of time during pupil constriction and dilation. Wavefront aberration measurements are used to objectively measure the state of the eye refraction that defines the desired vision characteristic. The measured state of refraction is expressed with a mathematical function enabling correction of the pre-selected vision characteristic to achieve the desired quality of vision. The mathematical expression function may be a Zernike polynomial having both second order and higher order terms or a function determined by spline mathematical calculations. Pre-selected vision characteristics may be determined using ray tracing technology.


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