The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 25, 2007

Filed:

May. 06, 2004
Applicants:

Takuei Ishikawa, Tokyo, JP;

Kazuhiro Nakajima, Yokohama, JP;

Koichiro Nakazawa, Tokyo, JP;

Katsuhiro Shirota, Kawasaki, JP;

Inventors:

Takuei Ishikawa, Tokyo, JP;

Kazuhiro Nakajima, Yokohama, JP;

Koichiro Nakazawa, Tokyo, JP;

Katsuhiro Shirota, Kawasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 2/01 (2006.01);
U.S. Cl.
CPC ...
Abstract

A width A of the scanning area of the ink ejection orifices and a width B of the scanning area of the reacting liquid ejection orifices are respectively set as A=(n−a)×p and B=n×p, while amount of the feeding of the printing sheet during each scan corresponds to the width of the scanning area of the reacting liquid ejection orifices, that is, A=(n−a)×p. With this system, the width of the scanning area, wherein ejection of the reacting liquid precedes ejection of the ink, is made shorter by C=a×p than the width of following scanning area; the scanning area having the width C is scanned two times by the row of the ink ejection orifices, and the thinning process is applied to this area having the width C.


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