The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 18, 2007

Filed:

Feb. 04, 2005
Applicants:

Weishi Feng, San Jose, CA (US);

Liang Zhang, Union City, CA (US);

Zhan Yu, Sunnyvale, CA (US);

Inventors:

Weishi Feng, San Jose, CA (US);

Liang Zhang, Union City, CA (US);

Zhan Yu, Sunnyvale, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/23 (2006.01); H03M 13/29 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system for detecting errors in received input data includes a first error detection circuit. The first error detection circuit is configured to receive the input data. The input data includes at least one of data and data with errors. The first error detection circuit is configured to generate a first error detection sequence in a first order. The system includes a second error detection circuit. The second error detection circuit is configured to receive the first error detection sequence and an error sequence. The error sequence is received in a second order that is different from the first order when there is data with errors. The second error detection circuit is configured to generate a second error detection sequence that indicates whether the error sequence is generated correctly.


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