The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 18, 2007
Filed:
Nov. 24, 1999
Applicants:
Sheng Liang, Cupertino, CA (US);
Steffen Grarup, Palo Alto, CA (US);
Inventors:
Sheng Liang, Cupertino, CA (US);
Steffen Grarup, Palo Alto, CA (US);
Assignee:
Sun Microsystems, Inc., Menlo Park, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G06F 12/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method and apparatus for profiling a heap. According to the method, a flexible and comprehensive general-purpose profiling interface that uniformly accommodates a wide variety of memory allocation and garbage collection methods is used. The profiling interface, among other things, employs a set of virtual machine profiling interface events that support all known types of garbage collection methods.
Liang, Sheng. (2007). Method for enabling comprehensive profiling of garbage-collected memory systems (U.S. Patent No. 7310718). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7310718
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile