The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 18, 2007
Filed:
Mar. 26, 2004
Raymond A. Birgenheier, Spokane, WA (US);
Richard P. Ryan, Spokane, WA (US);
Raymond A. Birgenheier, Spokane, WA (US);
Richard P. Ryan, Spokane, WA (US);
Agilent Technologies, Inc., Santa Clara, CA (US);
Abstract
A method and system characterizes an IF response of a receiver under test, such that an effect on the characterization by errors associated with uncertainties in knowledge of an RF stimulus signal used to perform the characterization is reduced. The method includes determining an estimate of an actual IF response of the receiver under test from IF responses of the receiver under test measured at overlapping frequency bands and a set of conversion coefficients computed therefrom, such that the estimate reduces the effect of the errors. The system includes a signal generator, an IF processor, a computer program, and a controller that controls the generator and the processor and executes the computer program. When a receiver under test is characterized, the receiver is connected between the signal generator, the IF processor and the controller. The computer program includes instructions that implement characterizing the receiver IF response.