The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 18, 2007
Filed:
Sep. 30, 2003
Eran Steinberg, San Francisco, CA (US);
Yury Prilutsky, San Mateo, CA (US);
Peter Corcoran, Claregalway, IE;
Petronel Bigioi, Galway, IE;
Adrian Zamfir, Bucharest, RO;
Vasile Buzuloiu, Bucharest, RO;
Danutz Ursu, Bucharest, RO;
Marta Zamfir, Bucharest, RO;
Eran Steinberg, San Francisco, CA (US);
Yury Prilutsky, San Mateo, CA (US);
Peter Corcoran, Claregalway, IE;
Petronel Bigioi, Galway, IE;
Adrian Zamfir, Bucharest, RO;
Vasile Buzuloiu, Bucharest, RO;
Danutz Ursu, Bucharest, RO;
Marta Zamfir, Bucharest, RO;
FotoNation Vision Limited, Galway, IE;
Abstract
A method of automatically correcting dust artifact regions within images acquired by a digital image acquisition system including a digital camera with a lens assembly includes determining probabilities that certain pixels within multiple digitally-acquired images correspond to one or more dust artifact regions. A statistical dust map is formed including mapped dust artifact regions based on the dust artifact determining. The mapped dust artifact regions are separated into aura regions partially obscured by dust and shadow regions substantially obscured by dust inside the aura regions. Digital data are corrected corresponding to pixels within one or more digitally-acquired images including dust artifact regions separated into aura regions and shadow regions correlated with mapped aura and shadow regions of the statistical dust map.