The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 18, 2007

Filed:

Nov. 25, 2003
Applicants:

Yogisha Mallya, Karnataka, IN;

Rakesh Mullick, Karnataka, IN;

Srikanth Suryanarayanan, Karnataka, IN;

Inventors:

Yogisha Mallya, Karnataka, IN;

Rakesh Mullick, Karnataka, IN;

Srikanth Suryanarayanan, Karnataka, IN;

Assignee:

General Electric Company, Niskayuna, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A technique is provided for segmenting a structure of interest from a volume dataset. The technique identifies regions of the structure using templates having characteristics of the structure of interest. The identified regions may then undergo a constrained growth process using dynamic constraints that may vary based on local statistics associated with the identified structure regions. Edges within the volume may be determined using gradient data determined by evaluating the strongest gradient between each pixel and all adjacent pixels. The edge data may be used to prevent the constrained growing process from exceeding the boundaries of the structure of interest.


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