The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 18, 2007
Filed:
Apr. 06, 2005
Siqun Wang, Wilmington, DE (US);
John C. Kralik, Devon, PA (US);
Siqun Wang, Wilmington, DE (US);
John C. Kralik, Devon, PA (US);
Agilent Technologies, Inc., Santa Clara, CA (US);
Abstract
A system for measuring properties of small volume samples includes a source of electromagnetic radiation; a first optical system; an optical delivery system; a sample holding assembly; a second optical system; a detecting system; an optical transmission system; a data collector interface component operatively connected to the detecting system; at least one processor; and at least one computer readable medium being capable of causing the at least one processor to: receive data from the detecting system corresponding to a measurement, calculate characteristics from the received data, organize the calculated characteristics in a predetermined ordering and output the organized predetermined ordering to the at least one computer readable medium.