The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 18, 2007
Filed:
Nov. 23, 2005
Dennis Joseph Coyle, Clifton Park, NY (US);
Micah Sakiestewa Sze, Albany, NY (US);
Masako Yamada, Niskayuna, NY (US);
Dennis Joseph Coyle, Clifton Park, NY (US);
Micah Sakiestewa Sze, Albany, NY (US);
Masako Yamada, Niskayuna, NY (US);
General Electric Company, Schenectady, NY (US);
Abstract
Disclosed herein is a method comprising illuminating a microstructured prism, or linear array of prisms of a prism sheet with an incident beam. The method further comprises making measurements of the refracted image of the beam on a measuring device to measure the distance disposed on an opposing side of the prism sheet from the side that the light beam is incident upon. Measurement of two angles of the refracted images of the beam on the ruled scale, measured twice, illuminating the sample at different angles are used in an equation to simultaneously provide the apex angle, the skew angle and the refractive index of the prism sheet.