The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 18, 2007
Filed:
Nov. 28, 2005
Umesh D. Navsariwala, Schaumburg, IL (US);
Nicholas E. Buris, Deer Park, IL (US);
Edward C. Porrett, Schaumburg, IL (US);
William J. Turney, Schaumburg, IL (US);
Umesh D. Navsariwala, Schaumburg, IL (US);
Nicholas E. Buris, Deer Park, IL (US);
Edward C. Porrett, Schaumburg, IL (US);
William J. Turney, Schaumburg, IL (US);
Motorola, Inc., Schaumburg, IL (US);
Abstract
A material properties detection system (). The system can include an antenna () that is tuned for operation within a frequency band over which the antenna transmits. The system also can include a transmitter () that generates electromagnetic energy across the frequency band and forwards the electromagnetic energy to the antenna. An impedance measurement circuit () can be provided. The impedance measurement circuit can measure an input impedance of the antenna over the frequency band and generate measured impedance data (). The system can include a material characterization application () that processes the measured impedance data to generate a material characterization for a structure () to which the antenna is proximate. The material characterization can include a dielectric constant, a permittivity, a loss tangent and/or a permeability.